Deutsch
Englisch
{$forschungsbereich}

AFM

Scanning probe microscope PSIA XE-100®

Technical specifications:

Mechanical:

  • Sample size: up to 100 x 100 mm, up to 20 mm thick
  • Sample mass: up to 500 g

X/Y Scanner:

  • Scan range: 50x50 µm
  • Resolution: < 0.15 nm

Z-Scanner:

  • Scan range: 12 µm
  • Resolution: < 0.05 nm

Available Testing Modes:

  • Contact mode
  • Non contact mode (for soft materials)
  • Tapping mode (identification of mechanical properties – phase lag)

 

Applications:

  • Identification of microstructure
  • Characterization of material phases
  • Phase imaging